Microtek is proud to announce the addition of high voltage testing capability for HAST based CAF testing.  The HAST chamber’s ability to maintain 85% Relative Humidity at temperatures over 100C at up to 1000 volts, generates the toughest CAF test environment currently possible for base material and PCB reliability evaluation.  According to Bob Neves, Chairman and CTO of Microtek, “we have successfully completed 2 high voltage CAF tests in our HAST chambers.  The Automotive and Transportation industries are continuing to push the limits of current test technology in an effort to further accelerate and understand the reliability of base materials and PCBs.  Microtek has, at the same time, continued to invest in equipment and technology to service these demands.”

Microtek’s commitment to Automotive and Transportation testing also includes the use of 12 Thermal Shock Chambers equipped for “Single Hole” or “Daisy Chain” reliability testing along with 30 Humidity and HAST chambers equipped with 256 channels of CAF/ECM/SIR testing capability up to 2000VDC.

For further information about Microtek Laboratories China, please contact:

Mr. Wythe Wang

Microtek (Changzhou) Laboratories

Electronic Technologies Park

No 19 Xinke Road

Changzhou, Jiangsu

China

wythewang@thetestlab.cn

www.thetestlab.cn